MEDIDAS DE TRANSMITANCIA ESPECTRAL SIN LA PRESENCIA DE FRANJAS DE INTERFERENCIA: UN MODELO PARA LA OBTENCIÓN DE LAS CONSTANTES ÓPTICAS EN PELÍCULAS DELGADAS SEMICONDUCTORAS
This tool is under development and it is available in Beta Test version
This tool is under development and it was published with the objective to test the usage and performance. All the indicators are real and they are gradually being loaded. Slowness and out of service problems may occur in this version.